DocumentCode :
1265376
Title :
Study of InGaN-Based Light-Emitting Diodes on a Roughened Backside GaN Substrate by a Chemical Wet-Etching Process
Author :
Fu, Yi-Keng ; Chen, Bo-Chun ; Fang, Yen-Hsiang ; Jiang, Ren-Hao ; Lu, Yu-Hsuan ; Xuan, Rong ; Huang, Kai-Feng ; Lin, Chia-Feng ; Su, Yan-Kuin ; Chen, Jebb-Fang ; Chang, Chun-Yen
Author_Institution :
Opto-Electron. Epitaxy & Device Dept., Ind. Technol. Res. Inst., Hsinchu, Taiwan
Volume :
23
Issue :
19
fYear :
2011
Firstpage :
1373
Lastpage :
1375
Abstract :
The InGaN-based light-emitting diodes (LEDs) with a roughened backside on the N-face surface of GaN substrate were fabricated through a chemical wet-etching process to increase light-extraction efficiency. The stable crystallographic etching planes were formed as the GaN {101̅1̅} planes. When the near-ultraviolet and blue LED were operated as a forward current of 20 mA, the output power of LEDs was improved from 13.2 and 19.9 mW to 25.6 and 24.0 mW, respectively. The different enhanced ratio is attributed to the different transmittance as a function of wavelength is caused from hexagonal pyramid on N-face GaN substrate after wet-etching process.
Keywords :
III-V semiconductors; etching; gallium compounds; indium compounds; light emitting diodes; light transmission; optical fabrication; ultraviolet sources; wide band gap semiconductors; GaN; InGaN; blue LED; chemical wet-etching process; crystallographic etching planes; light-emitting diodes; light-extraction efficiency; near-ultraviolet LED; optical fabrication; optical transmittance; Chemicals; Etching; Gallium nitride; Light emitting diodes; Power generation; Substrates; Chemical wet-etching; GaN; light extraction; near-ultraviolet (NUV) light-emitting diode (LED);
fLanguage :
English
Journal_Title :
Photonics Technology Letters, IEEE
Publisher :
ieee
ISSN :
1041-1135
Type :
jour
DOI :
10.1109/LPT.2011.2161276
Filename :
5940992
Link To Document :
بازگشت