Polarisation dependence of refractive index of MQW waveguides

Author

Hansen, S.I. ; Marsh, J.H. ; Roberts, J.S.

Author_Institution

Dept. of Electron. & Electr. Eng., Glasgow Univ., UK

Volume

138

Issue

5

fYear

1991

fDate

10/1/1991 12:00:00 AM

Firstpage

309

Lastpage

312

Abstract

The polarisation dependence of the refractive index of a multiple quantum well waveguide has been investigated using the grating coupler technique. The use of a layer of antireflection coating during the holographic definition of the gratings allows high contrast ratios to be routinely achieved, and by refining the grating coupler in a low-index material on top of the semiconductor and simplifying the measurement procedure, the precision of the results is enhanced and the timefactor of the measurements is reduced. Over the range of wavelengths from 840 to 880 nm, the refractive index of the multiple quantum well material was observed to change by 8×10^-2 and 6.7×10^-2 for the transverse electric and transverse magnetic polarisations, respectively. The birefringence of the material was observed to increase from 1.4×10^-2 at 880 nm to 2.7×10^-2 at 840 nm

Keywords

holographic gratings; integrated optics; light polarisation; optical waveguides; refractive index; semiconductor quantum wells; 840 to 880 nm; GaAs-AlGaAs; MQW waveguides; TE mode; TM node; antireflection coating; birefringence; grating coupler technique; high contrast ratios; holographic gratings; low-index material; multiple quantum well; optical couplers; polarisation dependence; refractive index; semiconductor;

fLanguage

English

Journal_Title

Optoelectronics, IEE Proceedings J

Publisher

iet

ISSN

0267-3932

Type

jour

Filename

99280