• DocumentCode
    1266362
  • Title

    Physical device simulation in a shrinking world

  • Author

    Lundstrom, Mark ; Datta, Supriyo

  • Author_Institution
    Optoelectron. Res. Center, Purdue Univ., West Lafayette, IN, USA
  • Volume
    6
  • Issue
    4
  • fYear
    1990
  • fDate
    7/1/1990 12:00:00 AM
  • Firstpage
    32
  • Lastpage
    37
  • Abstract
    The effect of shrinking device dimensions from micrometers to nanometers on the validity of device simulators is examined. It is shown that the assumptions underlying the drift-diffusion equation weaken when applied to small devices. Using the Monte Carlo method to simulate the microscopic motion of several thousand carriers as they travel through a device, an alternative approach that is beginning to find wide application in device engineering is discussed. Because the Monte Carlo method directly mimics carrier motion at a microscopic level, it provides highly accurate, detailed, realistic simulations of carrier transport in devices. However, it imposes a heavy computational burden, and the noise associated with the use of a relatively small sample-a few thousand electrons-sometimes limits its application. Nevertheless, its advantages continue to grow as device dimensions shrink. As the devices shrink to dimensions below 100 nm, the wave nature of electrons will play an increasingly important role, and even semiclassical Monte Carlo techniques are inadequate. Quantum approaches for use in that regime are considered.<>
  • Keywords
    Monte Carlo methods; carrier mobility; semiconductor device models; Monte Carlo method; carrier transport; device engineering; device simulators; drift-diffusion equation; nanometers; quantum approaches; shrinking device dimensions; wave nature; Computational modeling; Effective mass; Electrons; Equations; Impurities; Kinetic energy; Lattices; Particle scattering; Semiconductor devices; Silicon;
  • fLanguage
    English
  • Journal_Title
    Circuits and Devices Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    8755-3996
  • Type

    jour

  • DOI
    10.1109/101.59428
  • Filename
    59428