• DocumentCode
    1266896
  • Title

    A Simple Approach to Quantum Confinement in Tunneling Field-Effect Transistors

  • Author

    Padilla, J.L. ; Gámiz, F. ; Godoy, A.

  • Author_Institution
    Dept. de Electron. y Tecnol. de Comput., Univ. de Granada, Granada, Spain
  • Volume
    33
  • Issue
    10
  • fYear
    2012
  • Firstpage
    1342
  • Lastpage
    1344
  • Abstract
    We present an approach to account for quantum confinement in tunneling field-effect transistors (TFETs) based on the use of a nonlocal band-to-band tunneling model for carrier injection along with a self-consistent Schrödinger-Poisson model. Confinement will be considered to take place in one dimension, with the corresponding subband quantization of the conduction and valence bands derived from it. As a result of this quantization, the formerly continuous conduction and valence bands become forbidden states, and tunneling is assumed to occur between their first bound states. This causes an increase of the effective bandgap and, subsequently, of the tunneling barrier width, which greatly affects the total current in the device. Results corresponding to double-gate TFETs with different thicknesses show clear differences in their transfer characteristics when comparing the quantum approach including confinement to the semiclassical one.
  • Keywords
    Poisson equation; Schrodinger equation; conduction bands; energy gap; field effect transistors; semiconductor device models; tunnel transistors; valence bands; carrier injection; continuous conduction bands; double-gate TFET; effective bandgap; nonlocal band-to-band tunneling model; quantum confinement approach; self-consistent Schrödinger-Poisson model; subband quantization; tunneling field-effect transistors; valence bands; Logic gates; Mathematical model; Photonic band gap; Quantization; Transistors; Tunneling; Band-to-band tunneling; quantum confinement; tunneling field-effect transistor (TFET);
  • fLanguage
    English
  • Journal_Title
    Electron Device Letters, IEEE
  • Publisher
    ieee
  • ISSN
    0741-3106
  • Type

    jour

  • DOI
    10.1109/LED.2012.2207876
  • Filename
    6272315