• DocumentCode
    1266966
  • Title

    Compact and Accurate Models of Large Single-Wall Carbon-Nanotube Interconnects

  • Author

    Ferranti, Francesco ; Antonini, Giulio ; Dhaene, Tom ; Knockaert, Luc ; Orlandi, Antonio

  • Author_Institution
    Dept. of Inf. Technol. (INTEC), Ghent Univ., Ghent, Belgium
  • Volume
    53
  • Issue
    4
  • fYear
    2011
  • Firstpage
    1025
  • Lastpage
    1033
  • Abstract
    Single-wall carbon nanotubes (SWCNTs) have been proposed for very large scale integration interconnect applications and their modeling is carried out using the multiconductor transmission line (MTL) formulation. Their time-domain analysis has some simulation issues related to the high number of SWCNTs within each bundle, which results in a highly complex model and loss of accuracy in the case of long interconnects. In recent years, several techniques have been proposed to reduce the complexity of the model whose accuracy decreases as the interconnection length increases. This paper presents a rigorous new technique to generate accurate reduced-order models of large SWCNT interconnects. The frequency response of the MTL is computed by using the spectral form of the dyadic Green´s function of the 1-D propagation problem and the model complexity is reduced using rational-model identification techniques. The proposed approach is validated by numerical results involving hundreds of SWCNTs, which confirm its capability of reducing the complexity of the model, while preserving accuracy over a wide frequency range.
  • Keywords
    Green´s function methods; VLSI; carbon nanotubes; frequency response; integrated circuit interconnections; multiconductor transmission lines; time-domain analysis; 1D propagation; C; dyadic Green´s function; frequency response; interconnection length; multiconductor transmission line; rational-model identification; single-wall carbon-nanotube; time-domain analysis; very large scale integration interconnect; Computational modeling; Frequency domain analysis; Impedance; Integrated circuit interconnections; Mathematical model; Resistance; Time domain analysis; Model order reduction; nano-interconnects; single-wall carbon nanotubes (SWCNTs); transient analysis; transmission line (TL) modeling;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/TEMC.2011.2159207
  • Filename
    5944965