• DocumentCode
    1267118
  • Title

    Defect detection in textured materials using Gabor filters

  • Author

    Kumar, Ajay ; Pang, Grantham K H

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Hong Kong Univ., China
  • Volume
    38
  • Issue
    2
  • fYear
    2002
  • Firstpage
    425
  • Lastpage
    440
  • Abstract
    This paper investigates various approaches for automated inspection of textured materials using Gabor wavelet features. A new supervised defect detection approach to detect a class of defects in textile webs is proposed. Unsupervised web inspection using a multichannel filtering scheme is investigated. A new data fusion scheme to multiplex the information from the different channels is proposed. Various factors interacting the tradeoff for performance and computational load are discussed. This scheme establishes high computational savings over the previously proposed approaches and results in high quality of defect detection. Final acceptance of visual inspection systems depends on economical aspects as well. Therefore, a new low-cost solution for fast web inspection is also included in this paper. The experimental results conducted on real fabric defects for various approaches proposed in this paper confirm their usefulness
  • Keywords
    automatic optical inspection; computer vision; filtering theory; quality control; textile industry; wavelet transforms; Gabor filters; Gabor wavelet features; automated inspection; computational load; computational savings; computer vision; data fusion scheme; fabric defects; information multiplexing; multichannel filtering scheme; quality assurance; supervised defect detection approach; textile industry; textile webs; textured materials defect detection; unsupervised web inspection; visual inspection systems; Automation; Consumer electronics; Fabrics; Filtering; Gabor filters; Industry Applications Society; Inspection; Quality assurance; Textile industry; Throughput;
  • fLanguage
    English
  • Journal_Title
    Industry Applications, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-9994
  • Type

    jour

  • DOI
    10.1109/28.993164
  • Filename
    993164