DocumentCode :
1267615
Title :
Reduced ground bounce and improved latch-up suppression through substrate conduction
Author :
Gabara, Thaddeus
Author_Institution :
AT&T Bell Lab., Allentown, PA, USA
Volume :
23
Issue :
5
fYear :
1988
fDate :
10/1/1988 12:00:00 AM
Firstpage :
1224
Lastpage :
1232
Abstract :
The conventional method of bond wiring Vss pads on CMOS chips is examined. For p-type epitaxial CMOS on a p+ substrate, these Vss pads may not be required. Instead, the conduction path would be through the substrate to the ground plane on the package. This technique reduces the ground bounce and improves latch-up suppression. Furthermore, for input/output (I/O) bound chips, the substrate conduction method reduces the size of the I/O frame, reduces cost by decreasing die size, and improves performance by reducing conductor lengths on the chip. An ADVICE comparison was performed between the conventional and substrate conduction methods for connection VSS to a CMOS chip in 0.9-μm technology. Results of packaged-chip measurements are also presented
Keywords :
CMOS integrated circuits; VLSI; digital integrated circuits; integrated circuit technology; 0.9 micron; ADVICE comparison; CMOS chips; I/O frame size reduction; IC technology; PGA packages; VLSI; conductor lengths reduction; cost reduction; die size reduction; epitaxial CMOS; ground bounce reduction; latch-up suppression; packaged-chip measurements; substrate conduction; Bonding; Conductors; Costs; Electronics packaging; Inductance; Noise reduction; Substrates; Variable structure systems; Very large scale integration; Wires;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/4.5948
Filename :
5948
Link To Document :
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