• DocumentCode
    1267799
  • Title

    Adaptive architecture for CMOS BICS

  • Author

    Maidon, Y. ; Deval, Y. ; Badets, F. ; Begueret, J.B.

  • Author_Institution
    Lab. IXL, Bordeaux I Univ., Talence, France
  • Volume
    35
  • Issue
    17
  • fYear
    1999
  • fDate
    8/19/1999 12:00:00 AM
  • Firstpage
    1407
  • Lastpage
    1409
  • Abstract
    A CMOS built-in current sensor is proposed which is suitable for very low power supply current monitoring and low power supply voltage mixed circuits. It takes advantage of the parasitic resistor attached to an interconnection layer. Analysis and simulations reveal that the transducer is accurate, linear, transparent, highly sensitive and versatile. Process dependencies are taken into account. The sensor was fabricated in 0.6 μm technology and the characterising measurements are reported
  • Keywords
    CMOS integrated circuits; built-in self test; electric sensing devices; integrated circuit measurement; integrated circuit testing; mixed analogue-digital integrated circuits; 0.6 micron; BICS; CMOS; built-in current sensor; characterising measurements; mixed circuits; parasitic resistor; power supply current monitoring; process dependencies;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19991004
  • Filename
    803567