Title :
Adaptive architecture for CMOS BICS
Author :
Maidon, Y. ; Deval, Y. ; Badets, F. ; Begueret, J.B.
Author_Institution :
Lab. IXL, Bordeaux I Univ., Talence, France
fDate :
8/19/1999 12:00:00 AM
Abstract :
A CMOS built-in current sensor is proposed which is suitable for very low power supply current monitoring and low power supply voltage mixed circuits. It takes advantage of the parasitic resistor attached to an interconnection layer. Analysis and simulations reveal that the transducer is accurate, linear, transparent, highly sensitive and versatile. Process dependencies are taken into account. The sensor was fabricated in 0.6 μm technology and the characterising measurements are reported
Keywords :
CMOS integrated circuits; built-in self test; electric sensing devices; integrated circuit measurement; integrated circuit testing; mixed analogue-digital integrated circuits; 0.6 micron; BICS; CMOS; built-in current sensor; characterising measurements; mixed circuits; parasitic resistor; power supply current monitoring; process dependencies;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19991004
