Title :
Tough challenges as design and test go nanometer
Author :
Kapur, Rohit ; Williams, Thomas W.
Author_Institution :
Synopsys Inc., USA
fDate :
11/1/1999 12:00:00 AM
Abstract :
Test engineers are already hard pressed to ensure the quality of ICs despite ever shorter time to market and skyrocketing test costs. Nanometer technologies will only add to the challenge
Keywords :
integrated circuit design; integrated circuit testing; nanotechnology; IC design; IC testing; nanometer technology; Automatic testing; Bridge circuits; Delay; Design engineering; Integrated circuit synthesis; Integrated circuit testing; Logic testing; Manufacturing; Nanoscale devices; Timing;
