DocumentCode :
1268899
Title :
Automatic testing of integrated circuits
Author :
Bette, H.P.
Author_Institution :
Teradyne GmbH, Munich, West Germany
Volume :
23
Issue :
5
fYear :
1977
fDate :
5/1/1977 12:00:00 AM
Firstpage :
380
Lastpage :
384
Abstract :
If it is true that integrated circuits are the main elements in every modern electronic system, it must also be true that the testing of these components is of prime importance, not only to the manufacturer, but also to the user. Yet, conventional methods, based on the oscilloscope and the trace recorder, are no longer adequate. The question whether an integrated circuit is good or bad is subject to views and interpretations determined by a number of economic and application-oriented rules. Automatic equipment should be capable of meeting every test requirement. A multitude of technologies and the system user´s divergent interests demand problem-oriented test solutions if testing is to remain an economic propostion
fLanguage :
English
Journal_Title :
Electronics and Power
Publisher :
iet
ISSN :
0013-5127
Type :
jour
DOI :
10.1049/ep.1977.0211
Filename :
5184716
Link To Document :
بازگشت