• DocumentCode
    1268899
  • Title

    Automatic testing of integrated circuits

  • Author

    Bette, H.P.

  • Author_Institution
    Teradyne GmbH, Munich, West Germany
  • Volume
    23
  • Issue
    5
  • fYear
    1977
  • fDate
    5/1/1977 12:00:00 AM
  • Firstpage
    380
  • Lastpage
    384
  • Abstract
    If it is true that integrated circuits are the main elements in every modern electronic system, it must also be true that the testing of these components is of prime importance, not only to the manufacturer, but also to the user. Yet, conventional methods, based on the oscilloscope and the trace recorder, are no longer adequate. The question whether an integrated circuit is good or bad is subject to views and interpretations determined by a number of economic and application-oriented rules. Automatic equipment should be capable of meeting every test requirement. A multitude of technologies and the system user´s divergent interests demand problem-oriented test solutions if testing is to remain an economic propostion
  • fLanguage
    English
  • Journal_Title
    Electronics and Power
  • Publisher
    iet
  • ISSN
    0013-5127
  • Type

    jour

  • DOI
    10.1049/ep.1977.0211
  • Filename
    5184716