DocumentCode
126912
Title
Reliable ALU design with optimized voltage and implementation on 28nm FPGA
Author
Satyam, Kumar ; Pandey, Bishwajeet ; Saigal, Pooja ; Kumar, Tanesh ; Das, Teerath ; Yadav, J.
Author_Institution
Fast Conversion R&D Lab., New Delhi, India
fYear
2014
fDate
6-8 Feb. 2014
Firstpage
443
Lastpage
447
Abstract
In this work 40nm Virtex-6 and 28nm Artix7 is target Device. Xilinx 14.2 ISE is a Design tool, ALU is target Design. In this work, we apply voltage optimization to reduce dynamic power in both 28nm and 40nm technologies. With the help of voltage optimization, there is 93.74%, 93.64%, 93.52%, 93.51% and 93.54% reduction in power on 28nm for range of 1V-0.5V with step size of 0.1V on 100 MHz in comparison to power consumption on 40nm. There is 90.65%, 90.04%, 89.48%, 89.13% 88.99 and 88.88% reduction in power on for range of 1V-0.5V with step size of 0.1V on 1 GHz in comparison to 40nm technology FPGA. There is 69.39 %, 66.78%, 64.81%, 63.38%, 62.47% and 61.92% reduction in power on 28nm technology for range of 1V-0.5V with step size of 0.1V on 10 GHz. 32.86 %, 30.77%, 29.24%, 28.10%, 27.25% and 26.57% power reduction is possible on 28nm technology for range of 1V-0.5V with step size of 0.1V on 100 GHz. If device operating frequency is 1 THz, then 19.28%, 19.05%, 18.79%, 18.48%, 18.14% and 17.74% reduction in power on 28nm technology is possible for range of 1V-0.5V with step size of 0.1V on in comparison to power consumption of 40nm technology. 28nm Technology based FPGA is more power effective FPGA in comparison to 40nm technology based FPGA. On 100 MHz, power reduction is maximum i.e. 93.74%. On 1 THz, it is minimum i.e. 19.28%. Voltage Scaling is able to reduce total power consumption in range of 93.74%-19.28%.
Keywords
field programmable gate arrays; integrated circuit design; integrated circuit reliability; logic design; ALU design reliability; Artix7; Virtex-6; Xilinx 14.2 ISE; design tool; dynamic power reduction; frequency 1 THz; frequency 10 GHz; frequency 100 GHz; size 28 nm; size 40 nm; technology-based FPGA; total power consumption reduction; voltage 1 V to 0.5 V; voltage optimization; voltage scaling; Field programmable gate arrays; Irrigation; Reliability; Voltage control; FPGA; Global Reset; Operating Frequency; Power Optimization; Reliable Device; Voltage Optimization;
fLanguage
English
Publisher
ieee
Conference_Titel
Optimization, Reliabilty, and Information Technology (ICROIT), 2014 International Conference on
Conference_Location
Faridabad
Print_ISBN
978-1-4799-3958-9
Type
conf
DOI
10.1109/ICROIT.2014.6798381
Filename
6798381
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