• DocumentCode
    1269160
  • Title

    Condensed metal vapor on alumina ceramic in vacuum interrupters

  • Author

    Fink, Harald ; Gentsch, Dietmar ; Heimbach, Markus

  • Author_Institution
    ABB Calor Emag Mittelspannung GmbH, Ratingen, Germany
  • Volume
    9
  • Issue
    2
  • fYear
    2002
  • fDate
    4/1/2002 12:00:00 AM
  • Firstpage
    201
  • Lastpage
    206
  • Abstract
    Investigations have been carried out on the dielectric performance of the ceramic (high-purity alumina, Al2O3) surface in vacuum interrupters after switching. In order to examine the influence of the shielding on the protection of the ceramic surface against metal vapor condensation different types of vacuum interrupters (VIs) have been tested: VIs with and without shielding. Additionally, two contact materials CuCr: 75:25 wt% and WCAg: 56:4:40 wt% have been investigated to compare the adhesion of different metal vapors to alumina ceramic surfaces. After having performed a HV conditioning of the VIs, dc arcs with arbitrary arcing times were triggered between the contacts simulating the generation of metal vapor during high current interruption and load break switching. Between the arcing tests the insulation levels of all VIs have been tested by means of HV ac source. Afterwards the VIs were opened and the microstructure of the metallic condensate on the inner ceramic surface was analyzed by means of scanning electron microscopy (SEM) and atomic force microscopy (AFM). The integral chemical composition of the metallic film was investigated by inductive coupled plasma (ICP).
  • Keywords
    adhesion; alumina; atomic force microscopy; ceramic insulation; condensation; scanning electron microscopy; shielding; switchgear insulation; vacuum arcs; vacuum interrupters; Al2O3; CuCr; DC arc; HV conditioning; WCAg; adhesion; alumina ceramic; atomic force microscopy; chemical composition; contact material; current interruption; dielectric surface; inductive coupled plasma; insulation level; load break switching; metal vapor condensation; microstructure; protection; scanning electron microscopy; shielding; switching characteristics; vacuum interrupter; Adhesives; Atomic force microscopy; Ceramics; DC generators; Dielectrics; Inorganic materials; Insulation testing; Interrupters; Protection; Scanning electron microscopy;
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/94.993736
  • Filename
    993736