DocumentCode :
1269366
Title :
Using functional fault simulation and the difference fault model to estimate implementation fault coverage
Author :
Silberman, Gabriel M. ; Spillinger, Ilan
Author_Institution :
Dept. of Electr. Eng., Technion Israel Inst. of Technol., Haifa, Israel
Volume :
9
Issue :
12
fYear :
1990
fDate :
12/1/1990 12:00:00 AM
Firstpage :
1335
Lastpage :
1343
Abstract :
An approach to estimate the fault coverage of the implementation of a VLSI design obtained by fault simulation at the function level is presented. The proposed methodology begins by defining a fault model for the functional level, the difference fault model (DFM), which reflects all of the faults in the implementation level. Functional fault detection is recorded by performing a functional simulation of the design, with faults injected as determined by the DFM. The last step is to use the correspondence between the functional faults (in the DFM) and those of the implementation level to yield an estimate of the implementation fault coverage. The results obtained show a very good correlation between the estimated fault coverage, based on fault simulation at the functional level, and the actual fault coverage obtained by fault simulation on a gate-level implementation
Keywords :
VLSI; circuit analysis computing; digital integrated circuits; VLSI design; difference fault model; digital circuits; function level; functional fault simulation; implementation fault coverage estimation; Circuit faults; Circuit simulation; Circuit testing; Design for manufacture; Digital circuits; Fault detection; Libraries; Logic design; Very large scale integration; Yield estimation;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/43.62778
Filename :
62778
Link To Document :
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