DocumentCode
1269953
Title
Performance of distributed CFAR test under various clutter amplitudes
Author
Gowda, Chandrakanth H. ; Viswanathan, R.
Author_Institution
Dept. of Electr. Eng., Southern Illinois Univ., Carbondale, IL, USA
Volume
35
Issue
4
fYear
1999
fDate
10/1/1999 12:00:00 AM
Firstpage
1410
Lastpage
1419
Abstract
We evaluate the performances of several distributed constant false-alarm rate (CFAR) tests operating in different background clutter conditions. The analysis considers the detection of Rayleigh target in various clutters with the possibility of differing clutter power levels in the test cells of distributed radars. Numerical results studied for a two-radar system show how the false-alarm rate of the maximum order statistic (MOS) test changes with differences in the clutter power levels of the test cells. The analysis for the detection of Rayleigh target in Rayleigh clutter indicates that, with the power levels of differing test cells, the OR fusion rule can be quite competitive with the new normalized test statistic (NTS). However, for the detection of Rayleigh target in Weibull or K-distributed clutter, the results show that NTS outperforms both the OR and the AND rules under the condition of large signal-to-clutter power ratio and moderate shape parameter values
Keywords
Weibull distribution; adaptive signal detection; distributed tracking; normal distribution; radar clutter; radar detection; sensor fusion; K-distributed clutter; OR fusion rule; Rayleigh clutter; Rayleigh target detection; Weibull clutter; adaptive threshold; distributed CFAR test; distributed radar; large signal-to-clutter power ratio; maximum order statistic test; moderate shape parameter values; normalized test statistic; performance evaluation; two-radar system; various clutter amplitudes; Aerospace testing; Detectors; Electronic equipment testing; Radar clutter; Radar detection; Sensor fusion; Signal detection; Statistical analysis; Statistical distributions; System testing;
fLanguage
English
Journal_Title
Aerospace and Electronic Systems, IEEE Transactions on
Publisher
ieee
ISSN
0018-9251
Type
jour
DOI
10.1109/7.805457
Filename
805457
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