• DocumentCode
    1269953
  • Title

    Performance of distributed CFAR test under various clutter amplitudes

  • Author

    Gowda, Chandrakanth H. ; Viswanathan, R.

  • Author_Institution
    Dept. of Electr. Eng., Southern Illinois Univ., Carbondale, IL, USA
  • Volume
    35
  • Issue
    4
  • fYear
    1999
  • fDate
    10/1/1999 12:00:00 AM
  • Firstpage
    1410
  • Lastpage
    1419
  • Abstract
    We evaluate the performances of several distributed constant false-alarm rate (CFAR) tests operating in different background clutter conditions. The analysis considers the detection of Rayleigh target in various clutters with the possibility of differing clutter power levels in the test cells of distributed radars. Numerical results studied for a two-radar system show how the false-alarm rate of the maximum order statistic (MOS) test changes with differences in the clutter power levels of the test cells. The analysis for the detection of Rayleigh target in Rayleigh clutter indicates that, with the power levels of differing test cells, the OR fusion rule can be quite competitive with the new normalized test statistic (NTS). However, for the detection of Rayleigh target in Weibull or K-distributed clutter, the results show that NTS outperforms both the OR and the AND rules under the condition of large signal-to-clutter power ratio and moderate shape parameter values
  • Keywords
    Weibull distribution; adaptive signal detection; distributed tracking; normal distribution; radar clutter; radar detection; sensor fusion; K-distributed clutter; OR fusion rule; Rayleigh clutter; Rayleigh target detection; Weibull clutter; adaptive threshold; distributed CFAR test; distributed radar; large signal-to-clutter power ratio; maximum order statistic test; moderate shape parameter values; normalized test statistic; performance evaluation; two-radar system; various clutter amplitudes; Aerospace testing; Detectors; Electronic equipment testing; Radar clutter; Radar detection; Sensor fusion; Signal detection; Statistical analysis; Statistical distributions; System testing;
  • fLanguage
    English
  • Journal_Title
    Aerospace and Electronic Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9251
  • Type

    jour

  • DOI
    10.1109/7.805457
  • Filename
    805457