DocumentCode :
1269973
Title :
On the Modeling of Losses in Short Length Photonic Crystal Waveguides
Author :
Cryan, Martin J.
Author_Institution :
Dept. of Electr. & Electron. Eng., Univ. of Bristol, Bristol, UK
Volume :
27
Issue :
21
fYear :
2009
Firstpage :
4841
Lastpage :
4847
Abstract :
The 3-D finite difference time domain (FDTD) cut-back method is used to study losses in non-disordered photonic crystal silicon membrane waveguides. Losses above the light-line have been shown to be in good agreement with other methods. Below the light-line, however, FDTD is predicting a rapid increase in losses. This paper studies the possible causes for this effect, including meshing effects, back reflections, and finite thickness sidewalls. It is found that since below the light-line the group index becomes very high and the loss becomes very low, strong Fabry-Perot oscillations dominate the cut-back results. The paper also discusses the impact of operating near to the cut-off wavelength of the photonic crystal waveguide Bloch mode and the implications this has for loss calculation.
Keywords :
elemental semiconductors; finite difference time-domain analysis; optical losses; optical waveguide theory; photonic crystals; silicon; 3-D finite difference time domain cut-back method; Bloch mode; FDTD; Fabry-Perot oscillations; Si; back reflections; group index; losses; meshing effects; photonic crystal waveguides; silicon membrane; Photonic crystals;
fLanguage :
English
Journal_Title :
Lightwave Technology, Journal of
Publisher :
ieee
ISSN :
0733-8724
Type :
jour
DOI :
10.1109/JLT.2009.2028658
Filename :
5184918
Link To Document :
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