Title :
A Wideband Low-Power CMOS LNA With Positive–Negative Feedback for Noise, Gain, and Linearity Optimization
Author :
Woo, Sanghyun ; Kim, Woonyun ; Lee, Chang-Ho ; Kim, Hyoungsoo ; Laskar, Joy
Author_Institution :
Dept. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
A wideband common-gate (CG) low-noise amplifier (LNA) utilizing positive-negative-feedback technique is presented. The positive-negative-feedback technique boosts effective transconductance (Gm) and output impedance, which leads to an LNA with higher gain and lower noise figure (NF) over the previously reported amplifiers. In addition, this approach provides high linearity with an aid of third harmonic cancellation, and it breaks transconductance (gm) constriction for input matching in CG amplifiers. In this paper, linearity and output impedance improvement through the proposed technique are fully analyzed. An LNA prototype is implemented in 0.18- μm CMOS technology occupying a total area of 0.33 mm2. The implemented LNA delivers a maximum voltage gain of 21 dB, a minimum NF of 2 dB, an third-order intermodulation intercept point of -3.2 dBm, and 3.6 mW of power consumption in 300-920 MHz of 3-dB bandwidth with input matching (S11 <; -10 dB).
Keywords :
CMOS analogue integrated circuits; UHF amplifiers; low noise amplifiers; low-power electronics; wideband amplifiers; CG amplifiers; frequency 300 MHz to 920 MHz; gain 21 dB; gain optimization; harmonic cancellation; linearity improvement; linearity optimization; noise figure; noise figure 2 dB; noise optimization; output impedance improvement; positive-negative feedback technique; power 3.6 mW; size 0.18 mum; third-order intermodulation intercept point; transconductance; wideband common-gate low-noise amplifier; wideband low-power CMOS LNA; Impedance; Impedance matching; Noise; Noise measurement; Stability analysis; Topology; Wideband; CMOS; common gate (CG); feedback; low-noise amplifier (LNA); multistandard; wideband;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2012.2211379