• DocumentCode
    1270251
  • Title

    Statistical analysis of timing rules for high-speed synchronous VLSI systems

  • Author

    Li, Chung-Sheng ; Sivarajan, Kumar N. ; Messerschmitt, David G.

  • Author_Institution
    IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
  • Volume
    7
  • Issue
    4
  • fYear
    1999
  • Firstpage
    477
  • Lastpage
    482
  • Abstract
    Timing skew has been the major limitation for high-speed synchronous operation of a VLSI system. In this paper, a statistical timing model that accounts for both static and random timing skew is proposed. Based on this model, we analyze the timing rules of a synchronous VLSI system consisting of multiple pipelined stages, establish the yield of the system as a function of its device characteristics, and derive the relationship between the maximum throughput of such a system and its timing skew. The following timing schemes are evaluated: conventional pipelining, in which the transmitter cannot initiate the next cycle until the receiver has received the data and wave pipelining, in which the transmitter initiates the next cycle as soon as the current data has been sent out. The results show that the yield of a VLSI system using either of the pipelining schemes exhibits threshold behavior for Gaussian distributed static skew. Furthermore, the system throughput is shown to be very sensitive to the random skew.
  • Keywords
    VLSI; high-speed integrated circuits; integrated circuit design; logic CAD; pipeline processing; statistical analysis; timing; Gaussian distributed static skew; device characteristics; high-speed synchronous VLSI systems; maximum throughput; multiple pipelined stages; statistical analysis; threshold behavior; timing rules; timing skew; wave pipelining; Clocks; Digital systems; Integrated circuit interconnections; Logic; Pipeline processing; Statistical analysis; Throughput; Timing jitter; Transmitters; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/92.805754
  • Filename
    805754