Title :
Probabilistic Short-Circuit Uprating of Station Strain Bus System??? Reliability and Operating Considerations
Author :
Ramani, N. ; Wang, L. ; Tanaka, W.H. ; Macedo, F.X.
Author_Institution :
Ontario Hydro, Toronto, Canada
Keywords :
Capacitive sensors; Circuits; Conductors; Costs; Frequency; Insulation; Power system reliability; Production systems; Risk analysis; Security;
Journal_Title :
Power Engineering Review, IEEE
DOI :
10.1109/MPER.1986.5527605
