• DocumentCode
    127080
  • Title

    Automatic graph-based success tree construction and analysis

  • Author

    Aliee, Hananeh ; Glas, Michael ; Wanka, Rolf ; Teich, Jurgen

  • Author_Institution
    Hardware/Software Co-Design, Friedrich Alexander Univ. Erlangen-Nurnberg (FAU), Erlangen, Germany
  • fYear
    2014
  • fDate
    27-30 Jan. 2014
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    This paper presents a graph-based representation of success trees to evaluate the reliability of an embedded system. First, a success tree is constructed by deriving a characteristic function from a graph-based system model automatically. The constructed success tree is then translated to a graph (called a success graph) which supports both cyclic and acyclic data dependencies in applications to be mapped to the system resources and analyzed for reliability. To analyze the success graph, an algorithm called 0-propagation is introduced which propagates errors through the graph. The system fails if the errors propagate to the output of the success graph. Experimental results show that the proposed technique can simply and efficiently construct and analyze success trees of real-life embedded systems in a short time with negligible inaccuracy which suits well for evaluating the reliability of complex systems, e. g., as part of a design space exploration.
  • Keywords
    embedded systems; fault trees; formal specification; 0-propagation; acyclic data dependencies; automatic graph-based success tree construction; characteristic function; complex systems; cyclic data dependencies; design space exploration; embedded system; fault tree; graph-based representation; graph-based specification; graph-based system model; reliability evaluation; success graph; Algorithm design and analysis; Analytical models; Boolean functions; Embedded systems; Logic gates; Reliability; Stochastic processes; Success tree; design space exploration; fault tree; permanent fault; stochastic logic; transient fault;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium (RAMS), 2014 Annual
  • Conference_Location
    Colorado Springs, CO
  • Print_ISBN
    978-1-4799-2847-7
  • Type

    conf

  • DOI
    10.1109/RAMS.2014.6798487
  • Filename
    6798487