DocumentCode
127080
Title
Automatic graph-based success tree construction and analysis
Author
Aliee, Hananeh ; Glas, Michael ; Wanka, Rolf ; Teich, Jurgen
Author_Institution
Hardware/Software Co-Design, Friedrich Alexander Univ. Erlangen-Nurnberg (FAU), Erlangen, Germany
fYear
2014
fDate
27-30 Jan. 2014
Firstpage
1
Lastpage
7
Abstract
This paper presents a graph-based representation of success trees to evaluate the reliability of an embedded system. First, a success tree is constructed by deriving a characteristic function from a graph-based system model automatically. The constructed success tree is then translated to a graph (called a success graph) which supports both cyclic and acyclic data dependencies in applications to be mapped to the system resources and analyzed for reliability. To analyze the success graph, an algorithm called 0-propagation is introduced which propagates errors through the graph. The system fails if the errors propagate to the output of the success graph. Experimental results show that the proposed technique can simply and efficiently construct and analyze success trees of real-life embedded systems in a short time with negligible inaccuracy which suits well for evaluating the reliability of complex systems, e. g., as part of a design space exploration.
Keywords
embedded systems; fault trees; formal specification; 0-propagation; acyclic data dependencies; automatic graph-based success tree construction; characteristic function; complex systems; cyclic data dependencies; design space exploration; embedded system; fault tree; graph-based representation; graph-based specification; graph-based system model; reliability evaluation; success graph; Algorithm design and analysis; Analytical models; Boolean functions; Embedded systems; Logic gates; Reliability; Stochastic processes; Success tree; design space exploration; fault tree; permanent fault; stochastic logic; transient fault;
fLanguage
English
Publisher
ieee
Conference_Titel
Reliability and Maintainability Symposium (RAMS), 2014 Annual
Conference_Location
Colorado Springs, CO
Print_ISBN
978-1-4799-2847-7
Type
conf
DOI
10.1109/RAMS.2014.6798487
Filename
6798487
Link To Document