• DocumentCode
    1270808
  • Title

    Totally self-checking checker designs for Bose-Lin, Bose, and Blaum codes

  • Author

    Jha, Niraj K.

  • Author_Institution
    Dept. of Electr. Eng., Princeton Univ., NJ, USA
  • Volume
    10
  • Issue
    1
  • fYear
    1991
  • fDate
    1/1/1991 12:00:00 AM
  • Firstpage
    136
  • Lastpage
    143
  • Abstract
    The totally self-checking (TSC) circuit concept is well established in the area of concurrent error detection (CED). The outputs of a functional circuit are encoded and are monitored by a TSC checker. Thus errors can be detected concurrently with normal operation. Both permanent and transient faults can be detected. Some efficient systematic codes have been developed for detecting unidirectional errors in t or fewer bits (Bose-Lin code) and for detecting burst unidirectional errors (Bose and Blaum codes). Since unidirectional errors are the most common errors in VLSI circuits, such codes should find widespread use. TSC checker designs have been found for the three codes mentioned above. The designs are easily testable, relatively economical, and have a modular structure
  • Keywords
    VLSI; automatic testing; coding errors; error detection codes; fault location; integrated circuit testing; logic design; logic testing; Blaum codes; Bose code; Bose-Lin code; VLSI circuits; burst unidirectional errors; concurrent error detection; fault location; modular structure; permanent faults; self-checking checker; transient faults; Circuit faults; Circuit testing; Decoding; Electrical fault detection; Encoding; Error correction codes; Fault detection; Monitoring; Protection; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.62799
  • Filename
    62799