Title :
A reliability test-plan for series systems with components having stochastic failure rates
Author :
Nair, J. Hariharan ; Sabnis, Sanjeev V.
Author_Institution :
Dept. of Math., Indian Inst. of Technol., Mumbai, India
fDate :
3/1/2002 12:00:00 AM
Abstract :
This paper proposes a reliability test plan for a series system, by considering the parameter λj of the exponential distribution to be a random variable having uniform distribution over [0, θj], j = 1, 2,..., n. Explicit expressions are obtained for the optimal values of the tj, when the number of components in the system is 2. The general solution, albeit implicit, has also been obtained when the number of components in a given system is ⩾3. Mathematical programming is used to find the optimal solution and to illustrate it with numerical results
Keywords :
exponential distribution; mathematical programming; reliability; stochastic processes; Kuhn-Tucker conditions; component testing; components; consumer risk; cost minimization; exponential distribution; mathematical programming; producer risk; random variable; reliability test-plan; series systems; stochastic failure rates; system reliability; uniform distribution; Cost function; Distribution functions; Exponential distribution; Manufacturing; Mathematical programming; Random variables; Reliability; Stochastic processes; Stochastic systems; System testing;
Journal_Title :
Reliability, IEEE Transactions on