A reliability test-plan for series systems with components having stochastic failure rates

Author

Nair, J. Hariharan ; Sabnis, Sanjeev V.

Author_Institution

Dept. of Math., Indian Inst. of Technol., Mumbai, India

Volume

51

Issue

1

fYear

2002

fDate

3/1/2002 12:00:00 AM

Firstpage

17

Lastpage

22

Abstract

This paper proposes a reliability test plan for a series system, by considering the parameter λ_j of the exponential distribution to be a random variable having uniform distribution over [0, θ_j], j = 1, 2,..., n. Explicit expressions are obtained for the optimal values of the t_j, when the number of components in the system is 2. The general solution, albeit implicit, has also been obtained when the number of components in a given system is ⩾3. Mathematical programming is used to find the optimal solution and to illustrate it with numerical results

Keywords

exponential distribution; mathematical programming; reliability; stochastic processes; Kuhn-Tucker conditions; component testing; components; consumer risk; cost minimization; exponential distribution; mathematical programming; producer risk; random variable; reliability test-plan; series systems; stochastic failure rates; system reliability; uniform distribution; Cost function; Distribution functions; Exponential distribution; Manufacturing; Mathematical programming; Random variables; Reliability; Stochastic processes; Stochastic systems; System testing;

fLanguage

English

Journal_Title

Reliability, IEEE Transactions on

Publisher

ieee

ISSN

0018-9529

Type

jour

DOI

10.1109/24.994899

Filename

994899