DocumentCode :
1270876
Title :
Reliability modeling and assessment of the Star-Graph networks
Author :
Fitzgerald, Kent ; Latifi, Shahram ; Srimani, Pradip K.
Author_Institution :
TRW, Las Vegas, NV, USA
Volume :
51
Issue :
1
fYear :
2002
fDate :
3/1/2002 12:00:00 AM
Firstpage :
49
Lastpage :
57
Abstract :
The reliability of the Star Graph architecture is discussed. The robustness of the Star Graph network under node failures, link failures, and combined node and link failures is shown. The degradation of the Star Graph into Substar Graphs is used as the measure of system effectiveness in the face of failures. Models are provided for each of the failure and re-mapping modes evaluated herein, and the resilience of the Star Graph to failures is emphasized. This paper defines failure of a Star Graph as being when no fault-free (n - 1)-substars remain operational and the intermediate states are defined by the number of (n - 1)-substars that remain operational. A powerful tool (re-mapping) is introduced in which the number of operational (n 1)-substars can be maintained for longer periods, thus improving the overall MTTF (mean time to failure). For comparison the results of a similar reliability analysis of the hypercube is shown. The comparisons are considered conservative due to the failure model used herein for the star graph. One might apply re-mapping to hypercubes; while it would improve the overall MTTF of hypercubes, the hypercubes would still have an appreciably poorer performance than star graphs
Keywords :
failure analysis; fault tolerant computing; graph theory; hypercube networks; MTTF; Star Graph architecture; Star-Graph networks; Substar Graphs; combined node and link failures; failure model; fault-free substars; hypercube; intermediate states; link failures; mean time to failure; node failures; re-mapping mode; reliability analysis; reliability modeling; Degradation; Fault tolerance; Hypercubes; Maintenance; Multiprocessor interconnection networks; Network topology; Parallel algorithms; Reliability theory; Resilience; Robustness;
fLanguage :
English
Journal_Title :
Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9529
Type :
jour
DOI :
10.1109/24.994908
Filename :
994908
Link To Document :
بازگشت