DocumentCode :
1270922
Title :
Detection and classification of spectrally equivalent processes using higher order statistics
Author :
Coulon, Martial ; Tourneret, Jean-Yves ; Swami, Ananthram
Author_Institution :
Dept. of Electron. & Signal Process., Ecole Nat. Superieure d´´Electron., d´´Electrotech., d´´Inf. et d´´Hydraulique, Toulouse, France
Volume :
47
Issue :
12
fYear :
1999
fDate :
12/1/1999 12:00:00 AM
Firstpage :
3326
Lastpage :
3335
Abstract :
This paper addresses the problem of detecting two spectrally equivalent processes, which are modeled by a noisy AR process and an ARMA process. Higher order statistics (HOS) are shown to be efficient tools for detection. Two HOS-based detectors are derived for the binary hypothesis testing problem (i.e., known signal spectrum): The first detector exploits the asymptotic Gaussianity of the sample estimates of the cumulants. The second detector exploits the singularity of a certain matrix based on HOS. The more general composite hypothesis testing problem (i.e., with unknown signal spectrum) is then considered and a detector proposed. The performances of the different detectors are compared in terms of receiver operating characteristic (ROC) curves. Approximate closed-form expressions are derived for the threshold and the ROCs of the three detectors
Keywords :
Gaussian processes; approximation theory; autoregressive moving average processes; higher order statistics; matrix algebra; receivers; signal classification; signal detection; signal sampling; spectral analysis; ARMA process; HOS-based detectors; ROC curves; approximate closed-form expressions; asymptotic Gaussianity; binary hypothesis testing problem; cumulants; general composite hypothesis testing problem; higher order statistics; known signal spectrum; matrix singularity; noisy AR process; receiver operating characteristic; sample estimates; spectrally equivalent process classification; spectrally equivalent process detection; threshold; unknown signal spectrum; Closed-form solution; Detectors; Higher order statistics; Parametric statistics; Phase shift keying; Probability; Quadrature amplitude modulation; Signal processing; Statistical analysis; Testing;
fLanguage :
English
Journal_Title :
Signal Processing, IEEE Transactions on
Publisher :
ieee
ISSN :
1053-587X
Type :
jour
DOI :
10.1109/78.806076
Filename :
806076
Link To Document :
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