• DocumentCode
    1271224
  • Title

    Fault equivalence in PLAs and prevention design

  • Author

    Liu, B.-D. ; Shaw, G.T.

  • Author_Institution
    Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
  • Volume
    26
  • Issue
    23
  • fYear
    1990
  • Firstpage
    1925
  • Lastpage
    1926
  • Abstract
    The fault equivalent problem in PLAs is examined and some design rules to solve this problem are proposed. The hardware required is only one extra product line, one bit line and one output line for the worst case.
  • Keywords
    electrical faults; logic CAD; logic arrays; logic testing; PLA design; PLAs; bit line; built-in self-test; fault equivalent problem; output line; prevention design; product line;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19901246
  • Filename
    59524
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1271224