Title :
Readout circuit for CMOS active pixel image sensor
Author :
Kwok, T. ; Zhong, J.J. ; Wilkinson, T. ; Crossland, W.A.
Author_Institution :
Dept. of Eng., Cambridge Univ., UK
fDate :
3/28/2002 12:00:00 AM
Abstract :
The design and simulation results of a new readout circuit for a CMOS active pixel image sensor are presented. This scheme removes the fixed pattern noise and reduces the signal degradation while offering an increase in readout speed, compared with the conventional approach
Keywords :
CMOS image sensors; integrated circuit noise; readout electronics; CMOS active pixel image sensor; fixed pattern noise; readout circuit; signal degradation;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:20020248
