• DocumentCode
    1272171
  • Title

    Accelerated Destructive Degradation Tests Robust to Distribution Misspecification

  • Author

    Jeng, Shuen-Lin ; Huang, Bei-Ying ; Meeker, William Q.

  • Author_Institution
    Dept. of Stat., Nat. Cheng Kung Univ., Tainan, Taiwan
  • Volume
    60
  • Issue
    4
  • fYear
    2011
  • Firstpage
    701
  • Lastpage
    711
  • Abstract
    Accelerated repeated-measures degradation tests (ARMDTs) take measurements of degradation or performance on a sample of units over time. In certain products, measurements are destructive, leading to accelerated destructive degradation test (ADDT) data. For example, the test of an adhesive bond needs to break the test specimen to measure the strength of the bond. Lognormal and Weibull distributions are often used to describe the distribution of product characteristics in life and degradation tests. When the distribution is misspecified, the lifetime quantile, often of interest to the practitioner, may differ significantly between these two distributions. In this study, under a specific ADDT, we investigate the bias and variance due to distribution misspecification. We suggest robust test plans under the criteria of minimizing the approximate mean square error.
  • Keywords
    Weibull distribution; life testing; mean square error methods; ARMDT; Weibull distributions; accelerated destructive degradation tests; accelerated repeated-measures degradation tests; distribution misspecification; lifetime quantile; lognormal distributions; mean square error; Adhesives; Data models; Degradation; Life estimation; Log-normal distribution; Mean square error methods; Robustness; Weibull distribution; Distribution misspecification; Weibull; lognormal; mean square error; robust test plan;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.2011.2161051
  • Filename
    5953546