DocumentCode :
1272185
Title :
A signed-digit architecture for residue to binary transformation
Author :
Pourbigharaz, F.
Author_Institution :
Semicond. Corp., Ont., Canada
Volume :
46
Issue :
10
fYear :
1997
fDate :
10/1/1997 12:00:00 AM
Firstpage :
1146
Lastpage :
1150
Abstract :
A residue to binary converter architecture based on the Chinese Remainder Theorem (CRT) is presented. This is achieved by introducing a general moduli set Sk Sk={2m-1, 22om+1, 221m+1, 222m+1,....,222km +1} for Residue Number System (RNS) applications. Residue to binary converter architectures based on moduli sets So={2m-1, 2m+1} and S1=(2 m-1, 2m+1, 22m+1) are developed. The conversion procedure is performed in the following three levels: residue to signed-digit, signed-digit to binary, end-around carry addition/subtraction. In the first level of operation, the signed-digit representation of the CRT equation is realized by using redundant adder/subtracter blocks. Here, the necessary embedded multiplications are replaced by simple shift-left operations and the carry propagation is totally eliminated. In the second level, the redundant representation of CRT is directly converted to binary format. Finally, an end-around carry (EAC) addition/subtraction is performed to obtain the result at the third level of operation. The proposed architectures are simple, fast, free of memory blocks and module adders
Keywords :
adders; residue number systems; signal processing; Chinese remainder theorem; carry propagation; embedded multiplications; end-around carry addition; end-around carry addition/subtraction; end-around carry subtraction; general moduli set; moduli sets; redundant adder/subtracter blocks; residue to binary converter architecture; residue to binary transformation; signed-digit architecture; Adders; Cathode ray tubes; Digital arithmetic; Digital signal processing; Equations; Fault tolerant systems; Hardware; Signal processing algorithms; Very large scale integration;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/12.628400
Filename :
628400
Link To Document :
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