• DocumentCode
    1272428
  • Title

    Worst-case asymptotic properties of ℋ∞ identification

  • Author

    Chen, Jie ; Gu, Guoxiang

  • Author_Institution
    Dept. of Electr. Eng., California Univ., Riverside, CA, USA
  • Volume
    49
  • Issue
    4
  • fYear
    2002
  • fDate
    4/1/2002 12:00:00 AM
  • Firstpage
    437
  • Lastpage
    446
  • Abstract
    This paper studies asymptotic properties of ℋ∞ identification problems and algorithms. The sample complexity of time- and frequency-domain ℋ∞ identification problems is estimated, which exhibits a polynomial growth requirement on the input observation duration for the time-domain ℋ∞ identification problem, and a linear growth rate of frequency response samples required for the frequency-domain ℋ∞ identification problem. The divergence behavior is also established for linear algorithms for the time- and frequency-domain problems. The results extend previous work to more restricted sets of linear time-invariant systems with more refined a priori information, specifically imposed on the stability degree and the steady-state gain of the systems, thus demonstrating that no robustly convergent linear algorithms can exist even for a small set of exponentially stable systems
  • Keywords
    asymptotic stability; computational complexity; frequency response; frequency-domain analysis; identification; least squares approximations; linear systems; numerical stability; polynomials; time-domain analysis; Euler constant; H∞ identification problems; conjugate symmetry; disc algebra; divergence behavior; exponentially stable systems; frequency response samples; frequency-domain identification; input observation duration; least-squares algorithm; linear algorithms; linear growth rate; linear time-invariant systems; polynomial growth requirement; sample complexity; stability degree; steady-state gain; time-domain identification; worst-case asymptotic properties; Convergence; Frequency estimation; Frequency response; Interpolation; Lagrangian functions; Particle measurements; Polynomials; Robust stability; Robustness; Time domain analysis;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems I: Fundamental Theory and Applications, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1057-7122
  • Type

    jour

  • DOI
    10.1109/81.995658
  • Filename
    995658