• DocumentCode
    1273393
  • Title

    Foreword Special Issue on Characterization of Nano CMOS Variability by Simulation and Measurements

  • Author

    Sangiorgi, Enrico ; Asenov, Asen ; Bennett, Herbert S. ; Dutton, Robert W. ; Esseni, David ; Giles, M. D. ; Hane, M. ; Nishi, Kentaro ; Ranaweera, Jeewika ; Selberherr, Siegfried

  • Author_Institution
    University of Bologna, Bologna, , Italy
  • Volume
    58
  • Issue
    8
  • fYear
    2011
  • Firstpage
    2190
  • Lastpage
    2196
  • Abstract
    The five invited papers and 11 contributed papers in this special issue discuss topics such as process variation, device variability, hierarchical modeling tools, and address challenges such as device mismatch and SRAM noise margin variability.
  • Keywords
    CMOS technology; Circuit simulation; Nanoelectronics; Nanoscale devices; Special issues and sections;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2011.2160884
  • Filename
    5954170
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1273393