DocumentCode :
1273745
Title :
Reliability of integrated circuits ¿ the Eurocon perspective
Author :
Holmes, Lewis
Volume :
28
Issue :
7.8
fYear :
1982
Firstpage :
515
Lastpage :
518
Abstract :
The reliability of integrated circuits (ICs) has remained high through many generations of device technology. Although unreliable components can be bought, and must be guarded against, some types of ICs may have mean times to failure of thousands of years. An overview of current thinking on integrated-circuit reliability was provided at the recent Eurocon conference in Copenhagen
fLanguage :
English
Journal_Title :
Electronics and Power
Publisher :
iet
ISSN :
0013-5127
Type :
jour
DOI :
10.1049/ep.1982.0272
Filename :
5186167
Link To Document :
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