DocumentCode
1273850
Title
Approach to classification of blurred patterns with same symmetry
Author
Pan, Min-Cheng ; Lettington, A H
Author_Institution
J.J. Thomson Phys. Lab., Reading Univ., UK
Volume
35
Issue
19
fYear
1999
fDate
9/16/1999 12:00:00 AM
Firstpage
1620
Lastpage
1622
Abstract
An approach is proposed based on invariants extracted from projection maps to classify blurred patterns with the same symmetry. Results of simple, error, and true probabilities for classification are shown. Finally, a statistical curve to fit the integrated true probability is given
Keywords
pattern classification; probability; symmetry; blurred patterns; invariants extraction; pattern classification; pattern symmetry; probabilities; projection maps; statistical curve;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19991138
Filename
807028
Link To Document