• DocumentCode
    1273851
  • Title

    Toward optimal error distributions in adaptive finite-element electromagnetic analysis for microelectronic interconnection structures

  • Author

    Giannacopoulos, Dennis

  • Author_Institution
    Dept. of Electr. & Comput. Eng., McGill Univ., Montreal, Que., Canada
  • Volume
    38
  • Issue
    2
  • fYear
    2002
  • fDate
    3/1/2002 12:00:00 AM
  • Firstpage
    401
  • Lastpage
    404
  • Abstract
    The effectiveness of finite-element refinement criteria for achieving optimal meshes based on error equidistribution principles are investigated with benchmark systems for the electromagnetic simulation of microelectronic system interconnection (MSI) features. The usefulness of the criteria are evaluated for adaptive finite-element electromagnetic analysis of principal device characteristics present in practical MSI structures, which are known to pose challenging problems in numerical modeling. The criteria with, potentially, the most significant implications for MSI electromagnetic simulation, are examined with finite-element solutions for the fundamental benchmark systems computed from both optimal and adaptively refined discretizations
  • Keywords
    electromagnetic fields; error analysis; integrated circuit interconnections; integrated circuit modelling; mesh generation; MSI structures; adaptive finite-element electromagnetic analysis; benchmark systems; error equidistribution principles; microelectronic interconnection structures; numerical modeling; optimal error distributions; optimal meshes; refinement criteria; Analytical models; Computational efficiency; Computational modeling; Electromagnetic analysis; Electromagnetic fields; Electromagnetic modeling; Error analysis; Finite element methods; Microelectronics; Numerical models;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.996107
  • Filename
    996107