Title :
A Highly-Digital VCO-Based Analog-to-Digital Converter Using Phase Interpolator and Digital Calibration
Author :
Jang, Tae-Kwang ; Kim, Jaewook ; Yoon, Young-Gyu ; Cho, SeongHwan
Author_Institution :
Dept. of Electr. Eng., Korea Adv. Inst. of Sci. & Technol. (KAIST), Daejeon, South Korea
Abstract :
A first-order time-based ΔΣ modulator using voltage-controlled oscillator (VCO) is presented. The proposed modulator employs phase interpolation technique to enhance the time resolution of the VCO and digital calibration to improve the linearity of the VCO tuning curve. The proposed modulator, implemented in 0.13 μm CMOS process, achieves 55 dB peak signal-to-noise ratio and 52.5 dB peak signal-to-noise-and-distortion ratio at 600 MHz sampling frequency for 20 MHz input bandwidth and consumes 14.3 mW.
Keywords :
CMOS integrated circuits; interpolation; sigma-delta modulation; voltage-controlled oscillators; CMOS process; VCO tuning curve; VCO-based analog-to-digital converter; bandwidth 20 MHz; digital calibration; first-order time-based sigma-delta modulators; frequency 600 MHz; phase interpolator; power 14.3 mW; signal-to-noise ratio; signal-to-noise-and-distortion ratio; size 0.13 mum; time resolution; voltage-controlled oscillators; Calibration; Computer architecture; Delay; Interpolation; Microprocessors; Signal to noise ratio; Voltage-controlled oscillators; Analog-to-digital converter (ADC); calibration; phase interpolation; time-based ADC; voltage-controlled oscillator (VCO)-based ADC;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
DOI :
10.1109/TVLSI.2011.2159635
