Title :
A Non-Contact Dispensing Inker for Dice Marking of Wafer Detection
Author :
Lue Zhang ; Hong Hu ; Yong Cao
Author_Institution :
Shenzhen Grad. Sch., Harbin Inst. of Technol., Harbin, China
Abstract :
To make up the insufficiency and instability of contact inkers that are currently used for defective dice marking in integrated circuit production, a noncontact jetting inker is introduced in this paper. The volume of fluid (VOF)/continuum surface force (CFS) model is used to establish the mathematical description of jetting liquid into ambient air, and actuating pressure waveform is estimated for droplet generation. Subsequently, numerical simulation is taken to reveal the dynamic characteristics and generating mechanism of droplet jetting. Emergence and tolerance of satellite drops are also interpreted. With simple structure, a jetting inker is presented for ink dot distribution. The influences of actuation and nozzle size upon ink jetting performance are analyzed and numerical results are verified. Both simulation and experimental data indicate that the effectiveness, uniformity, and cleanness of dispensing performance can meet the requirements of wafer dice marking.
Keywords :
drops; integrated circuit testing; jets; wafer level packaging; CFS model; VOF model; continuum surface force; droplet generation; dynamic characteristic; ink dot distribution; integrated circuit production; noncontact dispensing inker; noncontact jetting inker; nozzle size; pressure waveform; satellite drop; volume of fluid; wafer detection; wafer dice marking; Atmospheric modeling; Equations; Ink; Mathematical model; Needles; Satellites; US Department of Defense; Droplet generation; ink marking; jetting dispenser;
Journal_Title :
Components, Packaging and Manufacturing Technology, IEEE Transactions on
DOI :
10.1109/TCPMT.2011.2159612