Circuit Design-Oriented Stochastic Piecewise Modeling of the Postbreakdown Gate Current in MOSFETs: Application to Ring Oscillators

Author

Martin-Martinez, Javier ; Kaczer, Ben ; Degraeve, Robin ; Roussel, Philippe J. ; Rodriguez, Rosana ; Nafria, Montserrat ; Aymerich, Xavier ; Dierickx, B. ; Groeseneken, Guido

Author_Institution

Dept. d´´Eng. Electron., Univ. Autonoma de Barcelona, Bellaterra, Spain

Volume

12

Issue

1

fYear

2012

fDate

3/1/2012 12:00:00 AM

Firstpage

78

Lastpage

85

Abstract

A methodology to incorporate the MOSFET gate dielectric breakdown (BD) failure mechanism in the design of complex systems is presented. The model accounts for the statistical nature of the BD phenomenon, is easily extensible to different device geometries and operation conditions (following the established scaling rules for the mechanism), considers the stress history, and can be easily implemented in circuit simulation tools. Device level characterization of the BD mechanism is presented, which is the base for model parameter extraction. The model has been introduced in a circuit simulator to show its suitability for evaluation of the BD effect in circuits and their reliability, taking ring oscillators as example.

Keywords

MOSFET; oscillators; semiconductor device breakdown; semiconductor device models; semiconductor device reliability; stress analysis; BD mechanism; MOSFET gate dielectric breakdown failure mechanism; circuit design-oriented stochastic piecewise modeling; circuit reliability; circuit simulation tools; device geometries; device level characterization; model parameter extraction; postbreakdown gate current; ring oscillators; stress history; Current measurement; Dielectrics; Electric breakdown; Integrated circuit modeling; Logic gates; Stress; Weibull distribution; CMOS; Circuit simulation; dielectric breakdown; reliability;

fLanguage

English

Journal_Title

Device and Materials Reliability, IEEE Transactions on

Publisher

ieee

ISSN

1530-4388

Type

jour

DOI

10.1109/TDMR.2011.2162238

Filename

5955107