Title :
Response Analysis of Metal-Enclosed Switchgear Shaken by Ground Oscillation
Author :
Mori, T. ; Uchida, T. ; Nakagaki, S. ; Matsuzawa, K. ; Sekiguchi, N. ; Kubota, T. ; Horie, T. ; Nishikawa, H.
Author_Institution :
Toshiba Corporation, Tokyo, Japan
Keywords :
Circuit faults; Dielectrics; Earth; Frequency; Laboratories; Modal analysis; Oscillators; Shape; Surges; Switches; Switchgear; Testing; Voltage transformers;
Journal_Title :
Power Engineering Review, IEEE
DOI :
10.1109/MPER.1986.5528245
