Title :
Josephson edge-triggered gates for sequential circuits
Author :
Yuh, P.-F. ; Yao, C.-T.
Author_Institution :
Hypres Inc., Elmsford, NY, USA
fDate :
3/1/1991 12:00:00 AM
Abstract :
A Josephson sequential logic family with a very wide operating margin (+or-67%) and insensitivity to global parameter variations is proposed. Derived from the original idea of the edge-triggered latching comparator by C. Hamilton et al. (see IEEE Trans Magnetics, vol.MAG-21, p.197-9, 1985), this logic gate consists of a pair of conventional gates in series biased by a delay clock. In normal operation, switching occurs in one and only one of the gates, depending on which one has the smaller critical current. The authors have built and tested a few circuits to illustrate this logic gate design: a 32-b shift register designed by OR gates with +or-42% bias margin and +or-89% input margin, a 4-b pseudorandom sequence generator designed by exclusive-OR gates with +or-27% bias margin and +or-78% input margin, and cross section of a 6-b NOR gate decoder with +or-33% bias margin.<>
Keywords :
logic gates; sequential circuits; shift registers; superconducting logic circuits; 32 bit; 4 bit; 6 bit; Josephson edge-triggered gates; Josephson sequential logic family; NOR gate decoder; OR gates; bias margin; critical current; edge-triggered latching comparator; exclusive-OR gates; input margin; logic circuits; pseudorandom sequence generator; sequential circuits; shift register; wide operating margin; Circuit testing; Clocks; Critical current; Delay; Josephson junctions; Logic design; Logic gates; Logic testing; Magnetics; Sequential circuits;
Journal_Title :
Applied Superconductivity, IEEE Transactions on