• DocumentCode
    1274444
  • Title

    Equivalent Circuit Model for a GaN Gate Injection Transistor Bidirectional Switch

  • Author

    Ide, Toshihide ; Shimizu, Mitsuaki ; Shen, Xu-Qiang ; Morita, Tatsuo ; Ueda, Tetsuzo ; Tanaka, Tsuyoshi

  • Author_Institution
    Adv. Power Electron. Res. Center, Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba, Japan
  • Volume
    59
  • Issue
    10
  • fYear
    2012
  • Firstpage
    2643
  • Lastpage
    2649
  • Abstract
    The switching waveforms and losses of a GaN gate injection transistor (GIT) bidirectional switch, a type of four-terminal device, were analyzed for the first time using an equivalent circuit model. By applying a three-terminal model to the equivalent circuit model of the GIT bidirectional switch and by using the waveforms of the chopper circuit, the parameters were derived with high accuracy. Furthermore, gate resistance dependence was added to the input capacitance component connected to the gate terminal in order to contain the influence of the gate structure of the GIT. It was confirmed that the calculated switching waveforms and losses agree well with those of the experimental values with over 90% accuracy, even in cases where circuit conditions for circuit voltage, load current, and gate resistance were varied.
  • Keywords
    III-V semiconductors; choppers (circuits); equivalent circuits; field effect transistor switches; gallium compounds; semiconductor device models; wide band gap semiconductors; GIT bidirectional switch; GaN; capacitance component; chopper circuit; circuit conditions; circuit voltage; equivalent circuit model; four-terminal device; gate injection transistor bidirectional switch; gate resistance; load current; switching waveforms; three-terminal model; Capacitance; Equivalent circuits; Gallium nitride; Integrated circuit modeling; Logic gates; Switches; Switching circuits; Bidirectional switch; GaN; equivalent circuit model; hole injection; switching loss; three-terminal model;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2012.2211020
  • Filename
    6287570