Ultrabroad-band vertical transition for multilayer integrated circuits

Author

Zhu, Lei ; Wu, Ke

Author_Institution

Dept. of Electr. & Comput. Eng., Montreal Univ., Que., Canada

Volume

9

Issue

11

fYear

1999

fDate

11/1/1999 12:00:00 AM

Firstpage

453

Lastpage

455

Abstract

A vertical transition using wide-aperture coupling is proposed for ultrabroad-band design of multilayer integrated circuits. With an electrically wide aperture formed on the common ground plane of two-layered microstrip line structures, a significant enhancement of capacitively series coupling is observed at low frequency. This simple technique realizes a very flat frequency response of transmission over a very broad bandwidth. A two-layered transition is accurately characterized by applying a so-called “short-open calibration” (SOC) scheme to calibrate numerical results obtained from a full-wave method of moments (MoM). The transition shows several attractive features such as ultrabroad bandwidth, low radiation loss, and deep up-band rejection. Predictions are verified by measurements over a wide frequency range

Keywords

MMIC; calibration; frequency response; integrated circuit design; method of moments; microstrip lines; MMICs; capacitively series coupling; electrically wide aperture; flat frequency response; full-wave method of moments; multilayer integrated circuits; radiation loss; short-open calibration; two-layered microstrip line structures; two-layered transition; ultrabroad-band vertical transition; up-band rejection; wide-aperture coupling; Apertures; Bandwidth; Coupling circuits; Frequency measurement; Integrated circuit interconnections; MMICs; Microstrip; Microwave integrated circuits; Moment methods; Nonhomogeneous media;

fLanguage

English

Journal_Title

Microwave and Guided Wave Letters, IEEE

Publisher

ieee

ISSN

1051-8207

Type

jour

DOI

10.1109/75.808032

Filename

808032