• DocumentCode
    1275225
  • Title

    CSC - A procedure for coupled S-parameter calculations

  • Author

    Glock, Hans-Walter ; Rothemund, Karsten ; Van Rienen, Ursula

  • Author_Institution
    Inst. fur Allgemeine Elektrotechnik, Rostock Univ., Germany
  • Volume
    38
  • Issue
    2
  • fYear
    2002
  • fDate
    3/1/2002 12:00:00 AM
  • Firstpage
    1173
  • Lastpage
    1176
  • Abstract
    Large rf-structures are sometimes too complex to be calculated entirely in single simulation runs. Usually, if the structure has open ports, the scattering properties - the so-called S-parameters - are of primary interest. As a matter of fact, they can be derived from scattering properties of parts of the entire structure, which are calculated in the procedure presented here in separate, less expensive simulations. A very compact representation of the underlying theory was found, which is presented in the paper. Furthermore, a Mathematica application called CSC based on this formulation is introduced. CSC calculates the scattering properties of an object, which are a combination of an arbitrary structure of segments with previously calculated S-parameters. To illustrate the use of CSC, three examples are shown: higher order mode (HOM) coupling properties of components of the TESLA Test Facility without and with accelerating cavities and the coupling of polarizations in chains of structures with slight deviations from circular cross sections
  • Keywords
    S-parameters; accelerator RF systems; accelerator cavities; electromagnetic coupling; waveguide couplers; Mathematica CSC package; RF structure; TESLA Test Facility; accelerating cavity; coupled S-parameter calculation; higher order mode coupler; numerical simulation; polarization coupling; scattering properties; Computational modeling; Couplers; Life estimation; Microwave propagation; Optical coupling; Polarization; Scattering parameters; Shape; Test facilities; Waveguide components;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.996300
  • Filename
    996300