A comparison between finite element calculations and experimental results on InGaAsP/InP waveguides

Author

Neubauer, Claus ; März, Reinhard ; Schienle, Meinrad

Author_Institution

Fraunhofer-Gesellschaft, Inst. fuer Integrierte Schaltungen, Erlangen, West Germany

Volume

8

Issue

12

fYear

1990

fDate

12/1/1990 12:00:00 AM

Firstpage

1932

Lastpage

1936

Abstract

Calculated and measured properties of InGaAsP/InP waveguides are compared. The spectral response of Bragg gratings was used to measure precisely the effective indexes of the guided modes of InGaAsP/InP waveguides. The shape of the near fields and the effective refractive indexes of waveguides, which support more than one guided mode, show an excellent agreement between theory and experiment. It is shown that rigorous calculation methods such as the finite-element method can be used to predict exactly the optical properties of integrated devices

Keywords

III-V semiconductors; finite element analysis; gallium arsenide; gallium compounds; indium compounds; integrated optics; optical waveguides; refractive index measurement; Bragg gratings; InGaAsP-InP waveguides; effective indexes; effective refractive indexes; finite element calculations; guided modes; integrated devices; optical properties; refractive index measurement; spectral response; Bragg gratings; Finite element methods; Indium phosphide; Integrated optics; Optical devices; Optical refraction; Optical waveguide theory; Optical waveguides; Refractive index; Shape;

fLanguage

English

Journal_Title

Lightwave Technology, Journal of

Publisher

ieee

ISSN

0733-8724

Type

jour

DOI

10.1109/50.62890

Filename

62890