Title :
Analog DFT using an undersampling technique
Author :
Mason, Ralph ; MA, Shing
Author_Institution :
Carleton Univ., Ottawa, Ont., Canada
Abstract :
This article presents a novel approach to analog design for test (DFT). The approach is based on wideband undersampling techniques using multiple samplers on-chip. Using this technique, signals being tested can be mixed down to lower frequencies before being brought off-chip
Keywords :
design for testability; analog design for test; multiple samplers on-chip; undersampling technique; Circuit testing; Convolution; Design for testability; Equations; Frequency response; Integrated circuit testing; Sampling methods; Switches; System testing; Wideband;
Journal_Title :
Design & Test of Computers, IEEE
