DocumentCode :
1275637
Title :
ITC 99 panels
Author :
Bhovsar, D.
Volume :
16
Issue :
4
fYear :
1999
Firstpage :
96
Lastpage :
99
Keywords :
Automatic test pattern generation; Design for testability; Educational institutions; Graphics; Logic devices; Logic testing; Manufacturing; National electric code; Production; System testing;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.1999.808229
Filename :
808229
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1275637
