Title :
Quantification of scattering from fiber surface irregularities
Author :
Avram, Elena ; Mahmood, Waqar ; Özer, Murat
Author_Institution :
CIENA Corp., Linthicum, MD, USA
fDate :
4/1/2002 12:00:00 AM
Abstract :
A quantitative description of the effects of fiber endface defects such as scratches and digs does not exist in the literature. We show, by considering surface scattering from the fiber endface, that such a description can be given in terms of a single parameter, which is a measure of the increase in backscattering due to the defect. We present our results in terms of some assumed values of this parameter
Keywords :
backscatter; light reflection; light scattering; optical fibre losses; rough surfaces; defect-induced backscattering; electromagnetic scattering; fiber endface; fiber endface defects; fiber endface digs; fiber endface scratches; fiber surface irregularities; optical fiber cables; optical fiber losses; optical fiber measurements; optical reflection; optical scattering; rough surfaces; scattering; surface contamination; surface scattering; surface scattering parameter; Acoustic beams; Acoustic scattering; Light scattering; Optical fibers; Optical scattering; Optical sensors; Optical surface waves; Rough surfaces; Surface acoustic waves; Surface roughness;
Journal_Title :
Lightwave Technology, Journal of
