• DocumentCode
    1276267
  • Title

    Fast three-step method for shear moduli calculation from quartz crystal resonator measurements

  • Author

    Behling, Carsten ; Lucklum, Ralf ; Hauptmann, Peter

  • Author_Institution
    Continental Teves AG & Co., Frankfurt, Germany
  • Volume
    46
  • Issue
    6
  • fYear
    1999
  • Firstpage
    1431
  • Lastpage
    1438
  • Abstract
    Quartz crystal resonator measurements can be used for polymer material characterization. The non-gravimetric regime of these resonators is exploited: the electrical response of polymer-coated quartz resonators depends on the polymer shear modulus. Previously reported methods employ an electrical admittance analysis together with difficult and time-consuming data fitting procedures to calculate the film shear modulus. This contribution presents a fast and accurate three-step method for the calculation of complex shear moduli of polymer films from quartz crystal resonator measurements. In the first step, the acoustic load impedance is calculated from the electrical admittance of the quartz crystal. The key point of this method is the application of a family of approximations for the calculation of the shear modulus from the acoustic load impedance in the second step. In the third step, the best approximation is improved further in an iterative procedure.
  • Keywords
    crystal resonators; iterative methods; nondestructive testing; polymers; shear modulus; acoustic load impedance; data fitting procedures; electrical admittance analysis; electrical response; film shear modulus; iterative procedure; nongravimetric regime; polymer material characterization; polymer-coated quartz resonators; quartz crystal resonator measurements; shear moduli calculation; three-step method; Acoustic measurements; Admittance measurement; Coatings; Crystalline materials; Elasticity; Electric variables measurement; Frequency; Impedance; Polymer films; Viscosity;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/58.808866
  • Filename
    808866