• DocumentCode
    1276343
  • Title

    Oversampled pipeline A/D converters with mismatch shaping

  • Author

    Shabra, Ayman ; Lee, Hae-Seung

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., MIT, Cambridge, MA, USA
  • Volume
    37
  • Issue
    5
  • fYear
    2002
  • fDate
    5/1/2002 12:00:00 AM
  • Firstpage
    566
  • Lastpage
    578
  • Abstract
    This paper presents a pipeline analog-to-digital converter (ADC) with improved linearity. The linearity improvement is achieved through a combination of oversampling and mismatch shaping, which modulates the distortion energy out of band. Mismatch shaping can be realized in a traditional 1-bit/stage pipeline ADC, but the ADCs transfer characteristic properties limit its effectiveness at pushing the distortion out of band. These limitations can be alleviated by using a 1-bit/stage commutative feedback capacitor switching pipeline design. A test chip was fabricated in a 0.35-μm CMOS process to demonstrate mismatch shaping. Experimental results obtained indicate that the spurious-free dynamic range improves by 8.5 dB to 76 dB when mismatch shaping is used at an oversampling ratio of 4 and a sampling rate of 61 MHz. The signal-to-noise and distortion ratio improves by 3 dB and the maximum integral nonlinearity decreases from 1.8 to 0.6 LSB at the 12-bit level
  • Keywords
    CMOS integrated circuits; analogue-digital conversion; circuit feedback; pipeline processing; thermal noise; 0.35 micron; 12 bit; 61 MHz; CMOS; commutative feedback capacitor switching; distortion energy; linearity; maximum integral nonlinearity; mismatch shaping; oversampled pipeline A/D converters; oversampling; oversampling ratio; sampling rate; signal-to-noise and distortion ratio; spurious-free dynamic range; transfer characteristic properties; Analog-digital conversion; CMOS process; Capacitors; Distortion; Dynamic range; Feedback; Linearity; Pipelines; Signal sampling; Testing;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.997849
  • Filename
    997849