• DocumentCode
    1276702
  • Title

    Strong self-focusing of a 7.2 MeV electron beam striking an aluminized mylar target

  • Author

    Vermare, C. ; Labrouche, J. ; De Gabory, P. Le Taillandier ; Villate, D. ; Donohue, J.T.

  • Author_Institution
    CEA, Centre d´´Etudes Sci. et Tech. d´´Aquitaine, Le Barp, France
  • Volume
    27
  • Issue
    6
  • fYear
    1999
  • fDate
    12/1/1999 12:00:00 AM
  • Firstpage
    1566
  • Lastpage
    1571
  • Abstract
    A substantial reduction in the spot size of a 7.2 MeV, 3 kA electron beam illuminating a thin aluminized mylar target has been observed during a 60 ns pulse. We attribute this to the emission of positive ions from the target, under the influence of the high energy flux of the beam, which perforates the target, These ions are then accelerated upstream and focused along the axis by the electron beam, where they partially neutralize the space-charge of the beam and produce a sharp pinch. After the pinch, the beam expands and forms filaments at the end of the pulse. By varying the initial beam transverse size, we have studied the influence of the beam density on the effect. A simulation of the effect with a particle-in-cell code provides a qualitative description and suggests that the ions responsible for the effect are Al+ and O+
  • Keywords
    aluminium; electron beam focusing; electron-surface impact; polymer films; self-focusing; space charge; 3 kA; 60 ns; 7.2 MeV; Al; O; electron beam illumination; high energy flux; induction machine; ion acceleration; ion beam focusing; particle beam diagnostics; particle beam measurement; secondary ion emission; space-charge partial neutralisation; spot size; strong self-focusing; target perforation; thin aluminized mylar target; upstream acceleration; Acceleration; Electron beams; Induction generators; Induction machines; Ion accelerators; Ion emission; Particle accelerators; Particle beam measurements; Particle beam optics; Particle beams;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/27.808927
  • Filename
    808927