• DocumentCode
    1276833
  • Title

    Unified Formulation for Multiple Vias With or Without Circular Pads in High Speed Interconnects

  • Author

    Guo, Zhonghai ; Pan, Guangwen George ; Pan, Helen K.

  • Author_Institution
    Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ, USA
  • Volume
    1
  • Issue
    8
  • fYear
    2011
  • Firstpage
    1226
  • Lastpage
    1233
  • Abstract
    A unified full-wave characterization of massive number of vias with or without circular pads is formulated analytically by means of equivalent magnetic frill array model and Galerkin´s procedure. The proposed method takes advantage of the parallel-plate structure and employs image theory and Fourier transform to simplify the problem from 3-D configuration into 2-D frame. Based on the cylindrical symmetry with Bessel´s functions and addition theorem, the final matrix equation is formulated analytically which can be used immediately for sensitivity analysis in both via dimensions and pad size. As a result, the new method is simple, efficient, and accurate. Numerical examples demonstrate good agreement between our analytical solution and the results obtained by commercial software (high frequency structure simulator) over a frequency range up to 20 GHz.
  • Keywords
    Bessel functions; Fourier transforms; Galerkin method; integrated circuit interconnections; 2D frame; 3D configuration; Bessel functions; Fourier transform; Galerkin procedure; addition theorem; circular pads; cylindrical symmetry; equivalent magnetic frill array model; final matrix equation; full wave characterization; high speed interconnects; image theory; massive number; multiple vias; unified formulation; Green´s function methods; Insertion loss; Integrated circuits; Magnetic resonance imaging; Mathematical model; Moment methods; Galerkin´s procedure; image theory; integrated circuits; magnetic frill;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    2156-3950
  • Type

    jour

  • DOI
    10.1109/TCPMT.2011.2149520
  • Filename
    5958584