DocumentCode :
1277069
Title :
A unified approach for the linear and nonlinear stability analysis of microwave circuits using commercially available tools
Author :
Mons, Sebastien ; Nallatamby, Jean-Christophe ; Quéré, Raymond ; Savary, P. ; Obregon, Juan
Author_Institution :
Microwave Lab., CNES, Toulouse, France
Volume :
47
Issue :
12
fYear :
1999
fDate :
12/1/1999 12:00:00 AM
Firstpage :
2403
Lastpage :
2409
Abstract :
For the first time, an exhaustive linear and nonlinear stability analysis of multitransistors monolithic-microwave integrated-circuit (MMIC) circuits is presented. A key point of the proposed stability analysis lies in that it can be easily implemented on any computer-aided design (CAD) software. The presented approach allows both linear and nonlinear stability analysis of any complex circuit fed by small or large signals. Two examples are given that demonstrate the accuracy of the method. The first example concerns a MMIC HBT power amplifier, which exhibited division frequency phenomena and spurious oscillations that were detected by simulations and confirmed by measurements. The second example deals with a voltage-controlled oscillator and demonstrates that the method can also predict spurious oscillations in autonomous circuits
Keywords :
MMIC; MMIC oscillators; MMIC power amplifiers; bifurcation; circuit CAD; circuit analysis computing; circuit oscillations; circuit stability; linear network analysis; nonlinear network analysis; CAD software; MMIC HBT power amplifier; MMIC VCO; autonomous circuits; commercially available tools; computer-aided design software; division frequency phenomena; heterojunction-bipolar-transistor power amplifier; linear stability analysis; microwave circuits; monolithic-microwave integrated-circuit; multitransistor MMICs; nonlinear stability analysis; spurious oscillations; unified approach; voltage-controlled oscillator; Circuit simulation; Design automation; Frequency conversion; Frequency measurement; Heterojunction bipolar transistors; MMICs; Power amplifiers; Power measurement; Stability analysis; Voltage-controlled oscillators;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.808987
Filename :
808987
Link To Document :
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