• DocumentCode
    1277076
  • Title

    A global finite-element time-domain analysis of active nonlinear microwave circuits

  • Author

    Chang, Sung-Hsien ; Coccioli, Roberto ; Qian, Yongxi ; Itoh, Tatsuo

  • Author_Institution
    Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
  • Volume
    47
  • Issue
    12
  • fYear
    1999
  • fDate
    12/1/1999 12:00:00 AM
  • Firstpage
    2410
  • Lastpage
    2416
  • Abstract
    An extension of the finite-element time-domain (FETD) method for mixed electromagnetic and circuit simulation of complex active microwave circuits is proposed in this paper. The passive distributed part of the circuit is analyzed using FETD and its interaction with lumped passive/active linear/nonlinear components is modeled via an equivalent-current generator whose value and internal capacitive admittance are computed at each time step by the FETD solver. Benchmark tests on a microwave amplifier and a injection-locked oscillator indicate that this extended FETD is not only superior in mesh flexibility, but also gives more accurate results than the similar FDTD-based algorithm
  • Keywords
    MMIC; active networks; circuit simulation; equivalent circuits; finite element analysis; injection locked oscillators; microwave amplifiers; microwave circuits; microwave oscillators; nonlinear network analysis; time-domain analysis; FETD method; active nonlinear microwave circuits; equivalent-current generator; finite-element time-domain analysis; global FE time-domain analysis; injection-locked oscillator; internal capacitive admittance; mesh flexibility; microwave amplifier; mixed electromagnetic and circuit simulation; passive distributed part; Admittance; Benchmark testing; Circuit analysis; Circuit analysis computing; Circuit simulation; Distributed computing; Finite element methods; Microwave circuits; Microwave theory and techniques; Time domain analysis;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.808988
  • Filename
    808988